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Work function analysis system
Consisting of piezoelectric driven
Kelvin Probe and Kelvin Control 07
Introduction
Work function measurements provide valuable information
on the physical, chemical, electronically and structural
state of surfaces. Many different investigation methods have
been developed in the past *.
The Kelvin Probe method however, proved to
be the most advantageous and versatile one. The method is
sensitive and absolutely non disturbing the surface state
of the specimen.
It is based on measuring the
Contact Potential Difference (CPD) between the sample and
a reference electrode.
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Our
work function analysis system consists of the
Kelvin Probe S, which can be installed easily in any
experimental chamber, and the Kelvin Control 07, which
drives the Kelvin Probe and measures the contact potential
difference.
The Kelvin Probe S and Kelvin Probe S compact features are high sensitivity, small demensions and easy handling. The installation
is extremely simple and flexible and in any position possible.
Operation in various environments and in a wide temperature
range renders many fields of application.
The Kelvin Probe S compact is developed for customers who prefer
smaller dimensions.
All features and advantages of this version
are identical with the Kelvin Probe S.
The Kelvin Control 07 electronics includes
all components needed for sensitive fast response and
low noise CPD mea-surements. The combination of electronics
for Kelvin Probe
drive and signal processing in one unit offers an easy
and uncomplicated operation. Usual problems like tuning,
frequency drift and unstable signal-phase relations are
eliminated. CPD changes can be registered continuously
in calibrated units.
For registration of the Contact Potential Difference you need in
addition:
Voltmeter or strip chart recorder or a commercial available AD
converter card for your computer.
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